inspection Staton
NEW!
Email: info@zhengwei-tech.com
Feature:
- Measure CD from 0.5u to 50u
- Measure Overlay from 0.05u to 5.0u
- Check for specific patterns - ie: wafer ID no. Bar Code etc.
- Check for bad exposure contrast.
- Software can be customized to analyze any visual pattern!
- Fully Custom software – customer can program the tool
Email: info@zhengwei-tech.com