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inspection Staton

NEW!

Feature:

- Measure CD from 0.5u to 50u

- Measure Overlay from 0.05u to 5.0u

- Check for specific patterns - ie: wafer ID no. Bar Code etc.

- Check for bad exposure contrast.

- Software can be customized to analyze any visual pattern!

- Fully Custom software – customer can program the tool

Email: info@zhengwei-tech.com