Products

inspection Staton

NEW!

Feature:

 - Measure CD from 0.5u to 50u
 - Measure Overlay from 0.05u to 5.0u
 - Check for specific patterns - ie: wafer ID no. Bar Code etc.
 - Check for bad exposure contrast.
 - Software can be customized to analyze any visual pattern!
 - Fully Custom software – customer can program the tool
 

Email: info@zhengwei-tech.com